Translated title of the contribution | : Method and system for evaluating overall symmetry of face |
Lo, L.-J. (Inventor),
Wan, S.-Y. (Inventor), ZHANG, Z.-Y. (Inventor) & CAI, P.-Y. (Inventor),
11 08 2017, IPC No. G06K 9/64(2006.01); A61B 5/103(2006.01); A61B 5/1171(2016.01); G06K 9/78(2006.01), Patent No. I595430
Research output: Patent