Project Details
Abstract
Research Topics focus on using carbon based materials for fabricating the carbon based solid state devices. Such as DLC acts as the insulated layer, the dielectric layer and the semiconductor layer of device
structure (that MIM, and MSM, and MIS). Initial study will focus on revealing the relationship between
process parameters and material, and evaluating the large area low cost carbon thin film process. Second is the devices fabrication and improving device performance and their feasibility study. Methods are (1) To develop large area of carbon material thin film deposition and build up a standardization (SOP) process, (2) Films preparation on the substrate as: silicon, and ITO and metal or plastic with doping and doping‐free of carbon thin film, are prepared by the innovated technique of electrodeposition methods (3) To explore the relationship between preparation conditions and film properties of DLC films (4) Forming ohmic and Schottky contacts and analysis of electrical properties (5) Fabrication of an electronic device structure and properties analysis (6)Film thickness, thermal stability, homogeneity, effect of surface roughness on electrical characteristics. (7) Modulation parameters, optimization of component electrical characteristics,
and (8) Build up a theoretical current transport model (9) A feasibility study on the applications of
carbon‐devices in future. (10) Results and published, patent apply, search for manufacturers, Startup
technology transfer opportunities and goals. In particular, project topics focus on the systematic establish the database of carbon thin film and their application in future. The scope of the study includes:
First year:
(1) Exploring the properties of DLC film deposited on the substrate such as Silicon, ITO and metal.
(2) Build up the relationship between characteristics of DLC thin films and process parameters.
(3) Electrical analysis on the contacts of the Metal with DLC film.
(4) Investigation on DLC thin film growth of windows.
(5) Carbon material thin film deposition and build up SOP process,
(6) Fabricating the carbon‐device with MIM structures and electrical property analysis.
(7) A feasibility study on the large area low cost carbon thin film process
Second year
(1) Fabricating Metal‐semiconductor‐Metal (MSM) structure of electronic component.
(2) Explore the relationships between characteristics of MSM device with preparation parameters.
(3) Establishing the current transfers and mechanisms of MSM structures.
(4) Carbon material thin film deposition and build up the SOP process of MSM device.
(5) Influence of parameters of large area carbon process on the MSM device reliability and improvement.
(6) Results and published, patent application, searching for manufacturers.
Third year
(1) Fabricating Metal‐Insulator‐Semiconductor (MIS) device structure and characteristics analysis.
(2) Explore the relationships between characteristics of MIS device with preparation parameters.
(3) Establishing the current transfers and mechanisms of MSM structures.
(4) An in‐depth study on the optimization of preparation technique, parameters and device characteristics.
(5) Establish full of preparation parameters and device characteristics, develop new device structure.
(6) A feasibility study and evaluation on carbon‐based electronic devices and their applications in future.
(7) Results and published, patent apply, manufacturers searching and startup technology transfer opportunities and goals.
Project IDs
Project ID:PB10308-4322
External Project ID:MOST103-2221-E182-069
External Project ID:MOST103-2221-E182-069
Status | Finished |
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Effective start/end date | 01/08/14 → 31/07/15 |
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