Project Details
Project IDs
Project ID:PB8801-0200
External Project ID:NSC88-2215-E182-001
External Project ID:NSC88-2215-E182-001
Status | Finished |
---|---|
Effective start/end date | 01/08/98 → 31/07/99 |
Keywords
- Ultra thin gate oxide
- Native oxide film
- Photo-resist ashing
- Deep submicron
- Direct tunneling current
- Soft breakdown
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