使用光刺激發光劑量計與金屬氧化物半導體場效電晶體於半導體輻射可靠度測試之應用

Translated title of the contribution: Applications of OSLD and MOSFET dosimeters in semiconductor radiation reliability tests

黃崑銘

Research output: Types of Thesis › Master's thesis

Translated title of the contributionApplications of OSLD and MOSFET dosimeters in semiconductor radiation reliability tests
Original languageChinese (Traditional)
Supervisors/Advisors
  • Chao, Ephraim Tsi-Chian, Supervisor
  • Lee, Chung-Chi, Supervisor
StatePublished - 2022
Externally publishedYes

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