| Translated title of the contribution | Applications of OSLD and MOSFET dosimeters in semiconductor radiation reliability tests |
|---|---|
| Original language | Chinese (Traditional) |
| Supervisors/Advisors |
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| State | Published - 2022 |
| Externally published | Yes |
使用光刺激發光劑量計與金屬氧化物半導體場效電晶體於半導體輻射可靠度測試之應用
- 黃崑銘
Research output: Types of Thesis › Master's thesis