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保護化合物半導體免於靜電放電破壞的方法
Translated title of the contribution
:
Method of protecting compound semiconductor from electrostatic discharge damages
Liann-Be Chang (Inventor)
, ZHENG-CHEN LIN (Inventor)
Graduate Institute of Electro-Optical Engineering
Research output
:
Patent
Overview
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Physics
Substrates
100%
Semiconductor
100%
Electrostatics
100%
Electrodes
80%
Capacitance
40%
Engineering
Conductive
100%
Electrostatic Discharge
100%
Substrates
55%
Insulation Layer
55%
Semiconductor
22%
Forming
22%
Capacitance
22%
High Dielectric Constant
11%
Layered Structure
11%
Material Science
Insulation
100%
Compound Semiconductor
100%
Electrode
80%
Semiconductor Material
40%
Capacitance
40%
Material
20%
Permittivity
20%