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可彎曲電子元件中沉積在聚合物基板上的納米雙金屬層的可靠性研究

Translated title of the contribution: Reliability Investigation of Nano-Bimetallic layers Deposited on Polymeric Substrates for Flexible Electronic Applications
  • 涂晏誠

Research output: Types of Thesis › Master's thesis

Translated title of the contributionReliability Investigation of Nano-Bimetallic layers Deposited on Polymeric Substrates for Flexible Electronic Applications
Original languageChinese (Traditional)
Supervisors/Advisors
  • Tan, Cher-Ming, Supervisor
  • Raghavan, Nagarajan, Supervisor, External person
StatePublished - 2021
Externally publishedYes

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