應用光學同調斷層掃描技術於導電玻璃瑕疵檢測及奈米厚度量測

Translated title of the contribution: Defect inspection and thickness measurement of conducting glass with optical coherence tomography
  • 黃國恩

Research output: Types of Thesis › Master's thesis

Translated title of the contributionDefect inspection and thickness measurement of conducting glass with optical coherence tomography
Original languageChinese (Traditional)
Supervisors/Advisors
  • Lee, Jiann-Der, Supervisor
StatePublished - 2012
Externally publishedYes

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