應用特徵挑選與離群值偵測於異常晶圓之分類

Translated title of the contribution: Applying Feature Selection and Outlier Detection to Abnormal Wafer Classification

楊哲勛

Research output: Types of Thesis › Master's thesis

Translated title of the contributionApplying Feature Selection and Outlier Detection to Abnormal Wafer Classification
Original languageChinese (Traditional)
Supervisors/Advisors
  • Wang, Jih-Chang, Supervisor
StatePublished - 2009
Externally publishedYes

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