新型p型閘極增強型氮化鎵高電子遷移率電晶體元件研製及其可靠度之研究

Translated title of the contribution: Reliability Investigation in Novel Enhancement-Mode p-GaN Gate HEMTs
  • 邱繼詮

Research output: Types of Thesis › Master's thesis

Translated title of the contributionReliability Investigation in Novel Enhancement-Mode p-GaN Gate HEMTs
Original languageChinese (Traditional)
Supervisors/Advisors
  • Chiu, Hsien-Chin, Supervisor
  • Yu, Chih-Jen, Supervisor
StatePublished - 2020
Externally publishedYes

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