| Translated title of the contribution | Investigation on the bending strength of silicon dies in the LoEF test and its comparison with the 3PB test |
|---|---|
| Original language | Chinese (Traditional) |
| Supervisors/Advisors |
|
| State | Published - 2025 |
| Externally published | Yes |
研究線負載於彈性基礎測試法用於評估薄矽晶片之彎曲強度並與三點彎曲測試法比較
謝博任
Research output: Types of Thesis › Master's thesis