神經受傷區段探測板、神經評估系統及神經評估方法

Translated title of the contribution: Nerve injured section inspection plate, nerve evaluation system and nerve evaluation method

TING-YU CHEN (Inventor), Chien-Chia Huang (Inventor), Yu-Cheng Pei (Inventor), CHENG-HONG LIN (Inventor)

Research output: Patent

Abstract

The present invention provides a nerve inspection plate suitable for nerve inspection, which comprises: a substrate and a plurality of inspection units. The inspection units are disposed on the substrate and arranged with an interval to each other. Each of the inspection units comprises an electrode and a conductive wire electrically connected to the electrode for signal transmission. During inspection, the electrode of the inspection units are attached onto the nerve, and an input signal is inputted via the conductive wire of one of the inspection units, then multiple corresponding output signals will be outputted via the conductive wires of other inspection units. Because the electrodes are in contact with the nerve having intervals to each other, the nerve inspection plate is able to quickly detect the reaction of the nerve through the electrodes, so as to quickly and accurately locate the injured section of the nerve.
Translated title of the contributionNerve injured section inspection plate, nerve evaluation system and nerve evaluation method
Original languageChinese (Traditional)
IPCA61B-005/04(2006.01);A61B-005/05(2006.01)
StatePublished - 01 08 2018

Bibliographical note

公開公告號: 2.01827006E8
Announcement ID: 2.01827006E8

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