膚質檢測探頭及其裝置

Translated title of the contribution: Skin quality inspection probe and apparatus thereof

Meng-Tsan Tsai (Inventor), FENG-YU CHANG (Inventor), CHENGCHUAN LI (Inventor)

Research output: Patent

Abstract

A skin quality inspection probe, which is utilized for receiving an inspection light and inspecting a to-be-tested portion, comprises a case, a reflective lens, a biaxial scanning mirror set and an objective lens. The case comprises an accommodation space, an opening and a hole. The inspection light is incident to the accommodation space of the case. The reflective lens arranged in the accommodation space of the case is utilized to receive and reflect the inspection light. The biaxial scanning mirror set arranged in the accommodation space of the case is utilized to receive the inspection light reflected from the reflective lens and is controlled to adjust the propagation direction of the inspection light. The objective lens, which is arranged in the hole of the case and connected to the case, is utilized to receive the inspection light emitted from the biaxial scanning mirror set and to converge the passing inspection light to irradiate on the to-be-tested portion. The skin quality inspection probe and a skin quality inspection probe apparatus are utilized for inspecting the to-be-tested portion.
Translated title of the contributionSkin quality inspection probe and apparatus thereof
Original languageChinese (Traditional)
Patent numberI580398
IPCA61B-005/00(2006.01)
StatePublished - 01 05 2017

Bibliographical note

公開公告號: I580398
Announcement ID: I580398

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