表面電漿共振量測系統

The present invention relates to a surface plasma resonance measurement system that comprises: a light source unit, which has a light exit surface that is a concave arc surface and provides incident light; a prism, which has an incident surface that is an arc configuration and corresponds to the light exit surface with the incident light incident onto the incident surface; a detection chip, which is arranged on a reflection surface of the prism and is set in contact engagement with an object-to-be-measured, a part of the detection chip in contact engagement with the object-to-be-measured being a detection zone, wherein the detection zone reflects the incident light as reflection light; and a detector, which detects the reflection light. As such, the present invention makes the light exit surface of the light source unit in a concave arc surface so that the incident light that is incident onto the detection zone of the detection chip from the light source unit may possess multiple angle values of incident angle, whereby there is no need to use a rotation mechanism to rotate the prism or the light source unit to generate different angles of incident light and thus, the size and manufacturing cost of the entire system can be reduced.