Abstract
The present invention provides a surface plasmon resonance measurement system, which comprises: an organic light emitting diode (OLED) light source, providing an incident light; a prism, having an incidence surface, a reflection surface and an exit surface, wherein the incident light enters the incidence surface; a polarizing film, provided on the exit surface or the incidence surface for adjusting a polarized angle of the incident light; a sensor chip, provided on the reflection surface, and contacting with at least one object under test, wherein the sensor chip and a contacted portion of the object under test forms a detection zone, and the detection zone reflects the incident light into a reflected light according to the object under test; and a detector, used for detecting the reflected light. Therefore, the present invention utilizes an OLED as an excitation light source, and utilizes a thin polarizing film in place of a conventional polarizing sheet, so as to achieve the object of reducing the size of the overall surface plasmon resonance system.
Translated title of the contribution | Surface plasma resonance measurement system |
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Original language | Chinese (Traditional) |
Patent number | I487893 |
IPC | G01N 21/55(2014.01) |
State | Published - 11 06 2015 |
Bibliographical note
公開公告號: I487893Announcement ID: I487893