表面電漿共振量測系統

Translated title of the contribution: Surface plasma resonance measurement system

YU-YING LEE (Inventor), Kou-Chen Liu (Inventor), BRILIANT ADHI PRABOWO (Inventor)

Research output: Patent

Abstract

The present invention provides a surface plasmon resonance measurement system, which comprises: an organic light emitting diode (OLED) light source, providing an incident light; a prism, having an incidence surface, a reflection surface and an exit surface, wherein the incident light enters the incidence surface; a polarizing film, provided on the exit surface or the incidence surface for adjusting a polarized angle of the incident light; a sensor chip, provided on the reflection surface, and contacting with at least one object under test, wherein the sensor chip and a contacted portion of the object under test forms a detection zone, and the detection zone reflects the incident light into a reflected light according to the object under test; and a detector, used for detecting the reflected light. Therefore, the present invention utilizes an OLED as an excitation light source, and utilizes a thin polarizing film in place of a conventional polarizing sheet, so as to achieve the object of reducing the size of the overall surface plasmon resonance system.
Translated title of the contributionSurface plasma resonance measurement system
Original languageChinese (Traditional)
Patent numberI487893
IPCG01N 21/55(2014.01)
StatePublished - 11 06 2015

Bibliographical note

公開公告號: I487893
Announcement ID: I487893

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