Abstract
本文主要是探討不同金膜厚度的Kretschmann組態所產生的表面電漿波之能量吸收光譜的
特性，並研究表面電漿波化學感測器應用在化學溶液之介電常數的偵測上。我們利用He-Ne雷射作
為光源，入射到鍍有金屬膜之Kretschmann組態，量測其反射光的能量強度對入射角的變化。同時
從理論模擬和實驗量測兩方面相互驗證，發現隨金膜厚度的增加，其表面電漿波能量吸收光譜之共
振吸收谷深度是成拋物曲線變化，當金膜厚度為46nm時，共振吸收谷為最深。運用最佳化金膜厚
度的Kretschmann組態製成的化學偵測器，測得待測物質：空氣、純水、乙醇（95%）、甲醇和葡萄
醣（5%）所對應的表面電漿波能量吸收光譜之共振吸收谷位置分別為：44、74.1、78.2、72.9、和75.2，
另外運用介質介電常數與共振吸收谷位置的相對關係，可求得溶液的介電常數。
The main researches of this paper are to find the reflectivity and absorptive spectrums of surface plasma wave (SPW) to any kinds of thickness of golden film in Kretschmann configuration. We also study the reflectivity to air, Water, ethyl alcohol, methyl alcohol, and glucose in condition of optimum thickness of thin golden film in a chemical sensor system.
The main researches of this paper are to find the reflectivity and absorptive spectrums of surface plasma wave (SPW) to any kinds of thickness of golden film in Kretschmann configuration. We also study the reflectivity to air, Water, ethyl alcohol, methyl alcohol, and glucose in condition of optimum thickness of thin golden film in a chemical sensor system.
| Original language | Chinese (Traditional) |
|---|---|
| Pages (from-to) | 91-97 |
| Journal | 中正嶺學報 |
| Volume | 27 |
| Issue number | 1 |
| State | Published - 1998 |