記憶體內運算的抗單粒子翻轉之性能比較

Translated title of the contribution: Comparison of Single Event Upset (SEU) Resistance in In-Memory Computing

吳東憑

Research output: Types of Thesis › Master's thesis

Translated title of the contributionComparison of Single Event Upset (SEU) Resistance in In-Memory Computing
Original languageChinese (Traditional)
Supervisors/Advisors
  • Li, Cheng-Wei, Supervisor
  • Wey, I-Chyn, Supervisor
StatePublished - 2024
Externally publishedYes

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