電壓波形諧波畸變對局部放電測試的影響檢討

潘慶龍, Wei-Neng Chang, 顏世雄

Research output: Contribution to journal › Journal Article › peer-review

Cite this

@article{4d65686c0f814d968a65fac2a9f8a1e2,

title = "電壓波形諧波畸變對局部放電測試的影響檢討",

keywords = "局部放電, 測試設備, 試驗, 諧波, 電力品質",

author = "慶龍潘 and Wei-Neng Chang and 世雄顏",

year = "2000",

language = "繁體中文",

pages = "30--34",

journal = "儀測技術雜誌",

number = "33",

}