0.2-μm gate-length InGaP-InGaAs DCFETs for C-band MMIC amplifier applications

Hsien Chin Chiu*, Shih Cheng Yang, Cheng Kuo Lin, Ming Jyh Hwu, Yi Jen Chan

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

Abstract

A C-band In0.49Ga0.51P-In0.15Ga 0.85As doped-channel FET (DCFET) monolithic power amplifier was designed and fabricated using low-k benzocyclobutene (BCB) interlayer technology. With a photosensitive low-k BCB interlayer (ε = 2.7), not only can the circuit's passivation layer, but also the capacitor insulator, via holes, and bridge process be realized simultaneously, where the process complexity and cost can be reduced. In addition, a 0.2-μm T-shaped gate InGaP-InGaAs doped-channel FET with a high current density and a high linearity is introduced to the amplifier using the e-beam lithography. This C-band power amplifier can achieve a linear power gain of 9.3 dB and an output power of 15.3 dBm, which proves that this novel MMIC process using low-k BCB interlayer technology is attractive for microwave and millimeter wave circuit applications.

Original languageEnglish
Pages (from-to)1599-1603
Number of pages5
JournalIEEE Transactions on Electron Devices
Volume50
Issue number7
DOIs
StatePublished - 2003
Externally publishedYes

Keywords

  • Benzocyclobutene (BCB)
  • Doped-channel FET (DCFET)
  • MMIC amplifiers
  • T-gates

Fingerprint

Dive into the research topics of '0.2-μm gate-length InGaP-InGaAs DCFETs for C-band MMIC amplifier applications'. Together they form a unique fingerprint.

Cite this