A 0.18μm probabilistic-based noise-tolerate circuit design and implementation with 28.7dB noise-immunity improvement

I. Chyn Wey*, You Gang Chen, Changhong Yu, Jie Chen, An Yen Wu

*Corresponding author for this work

Research output: Contribution to conferenceConference Paperpeer-review

22 Scopus citations

Abstract

As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the injected noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. In this paper, we design and implement an 8-bit Markov Random Field carry lookahead adder (MRF_CLA) probabilistic-based noise-tolerant circuit in 0.18μm CMOS process technology. This is the first working silicon design to prove the design concept of the noise-tolerant MRF circuits. The measurement results show that the proposed of the MRF adder can provide 28.7dB of noise-immunity as compared with its conventional CMOS design, when both circuits are facing the same server SNR environment. The MRF adder circuit can also achieve 10-6 BER when the supply voltage is only 0.45V and SNR is only 10dB.

Original languageEnglish
Pages291-294
Number of pages4
DOIs
StatePublished - 2006
Externally publishedYes
Event2006 IEEE Asian Solid-State Circuits Conference, ASSCC 2006 - Hangzhou, China
Duration: 13 11 200615 11 2006

Conference

Conference2006 IEEE Asian Solid-State Circuits Conference, ASSCC 2006
Country/TerritoryChina
CityHangzhou
Period13/11/0615/11/06

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