Abstract
Using a self-aligned sidewall microcrystalline-silicon (μ-Si) dual channel, comprising a sub-50-nm channel width, a novel 3-D stackable maskless embedded metal-gate thin-film-transistor nanowire device was fabricated on top metal using a tungsten gate-stack and trilayered oxide/nitride/oxide gate dielectric. The results of using a charge-transferring mechanism based on the solution-phased pH of a phosphate buffer solution and vascular endothelial growth factor showed that μ-Si surfaces exhibit high potential for use in bioelectronics. The device exhibits long-term reliability regarding bioelectronic probing and is as reliable as the commercially available enzyme-linked immunosorbent assay when conducting a targeted, 100-day therapy for ovarian cancer. Thus, the proposed device exhibits potential for use in label-free, economical, and highly reliable lab-on-chip 3-D applications.
Original language | English |
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Article number | 6740855 |
Pages (from-to) | 897-901 |
Number of pages | 5 |
Journal | IEEE Transactions on Electron Devices |
Volume | 61 |
Issue number | 3 |
DOIs | |
State | Published - 03 2014 |
Keywords
- Back end of line (BEOL) technology
- field-effect transistor (FET)
- lab on chip
- nanosensor fabrication
- nanowire semiconductive sensors