A high resolution FPGA-based merged delay line TDC with nonlinearity calibration

Yuan Ho Chen*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

This paper proposes a merged delay line (MDL) field-programmable gate array (FPGA) based time-to-digital converter (TDC). Instead of traditional tapped delay line (TDL), the proposed MDL-TDC merges several small delay cells to improve the linearity performance effectively. Implemented in a Xilinx XC5VLX110T-1FF1136 FPGA device, the proposed MDL-TDC has 50 ps time resolution, and the ranges of differential non-linearity (DNL) and integral non-linearity (INL) can be reduced 16.6% and 5.4% as compared with traditional one, respectively. Furthermore, 29 ps root-mean-square (RMS) is measured for the proposed MDL-TDC inputting a constant delay source. Therefore, the proposed MDL-TDC is recommended to implement in FPGA-based TDC achieving a high-resolution time and linearity performance.

Original languageEnglish
Title of host publication2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Pages2432-2435
Number of pages4
DOIs
StatePublished - 2013
Externally publishedYes
Event2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 - Beijing, China
Duration: 19 05 201323 05 2013

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Country/TerritoryChina
CityBeijing
Period19/05/1323/05/13

Keywords

  • Differential non-linearity
  • Field-programmable gate array
  • Merged delay line
  • Time-to-digital converter

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