A nonlinear PRNG using digitized logistic map with self-reseeding method

Chung Yi Li; Tsin Yuan Chang; Chien Chih Huang

doi:10.1109/VDAT.2010.5496703

A nonlinear PRNG using digitized logistic map with self-reseeding method

Chung Yi Li^*, Tsin Yuan Chang, Chien Chih Huang

^*Corresponding author for this work

National Tsing Hua University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

21 Scopus citations

Abstract

This paper proposes a self-reseeding pseudo RNG (PRNG) based on digitized logistic map to introduce small perturbations periodically so that the low-period can be removed and the randomness can be enhanced. The strategy and the optimization of selecting reseeding period with corresponding fixed pattern are demonstrated. The resultant PRNG generates random sequence fulfilling all the randomness requirements in proportion of NIST SP 800-22 test suite, and the average period can be more than 65 folds. Furthermore, the proposed PRNG is validated by a hardware implementation using TSMC 0.18 μm CMOS process with throughput faster than 250 Mbit/s.

Original language	English
Title of host publication	Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
Pages	108-111
Number of pages	4
DOIs	https://doi.org/10.1109/VDAT.2010.5496703
State	Published - 2010
Externally published	Yes
Event	2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010 - Hsin Chu, Taiwan Duration: 26 04 2010 → 29 04 2010

Publication series

Name	Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010

Conference

Conference	2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
Country/Territory	Taiwan
City	Hsin Chu
Period	26/04/10 → 29/04/10

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10.1109/VDAT.2010.5496703

Cite this

Li, C. Y., Chang, T. Y., & Huang, C. C. (2010). A nonlinear PRNG using digitized logistic map with self-reseeding method. In Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010 (pp. 108-111). Article 5496703 (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010). https://doi.org/10.1109/VDAT.2010.5496703

@inproceedings{108f391f1704448c82948696ca3aa36f,

title = "A nonlinear PRNG using digitized logistic map with self-reseeding method",

abstract = "This paper proposes a self-reseeding pseudo RNG (PRNG) based on digitized logistic map to introduce small perturbations periodically so that the low-period can be removed and the randomness can be enhanced. The strategy and the optimization of selecting reseeding period with corresponding fixed pattern are demonstrated. The resultant PRNG generates random sequence fulfilling all the randomness requirements in proportion of NIST SP 800-22 test suite, and the average period can be more than 65 folds. Furthermore, the proposed PRNG is validated by a hardware implementation using TSMC 0.18 μm CMOS process with throughput faster than 250 Mbit/s.",

author = "Li, {Chung Yi} and Chang, {Tsin Yuan} and Huang, {Chien Chih}",

year = "2010",

doi = "10.1109/VDAT.2010.5496703",

language = "英语",

isbn = "9781424452712",

series = "Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010",

pages = "108--111",

booktitle = "Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010",

note = "2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010 ; Conference date: 26-04-2010 Through 29-04-2010",

}

Li, CY, Chang, TY & Huang, CC 2010, A nonlinear PRNG using digitized logistic map with self-reseeding method. in Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010., 5496703, Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010, pp. 108-111, 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010, Hsin Chu, Taiwan, 26/04/10. https://doi.org/10.1109/VDAT.2010.5496703

A nonlinear PRNG using digitized logistic map with self-reseeding method. / Li, Chung Yi; Chang, Tsin Yuan; Huang, Chien Chih.
Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. 2010. p. 108-111 5496703 (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Li, Chung Yi

AU - Chang, Tsin Yuan

AU - Huang, Chien Chih

PY - 2010

Y1 - 2010

N2 - This paper proposes a self-reseeding pseudo RNG (PRNG) based on digitized logistic map to introduce small perturbations periodically so that the low-period can be removed and the randomness can be enhanced. The strategy and the optimization of selecting reseeding period with corresponding fixed pattern are demonstrated. The resultant PRNG generates random sequence fulfilling all the randomness requirements in proportion of NIST SP 800-22 test suite, and the average period can be more than 65 folds. Furthermore, the proposed PRNG is validated by a hardware implementation using TSMC 0.18 μm CMOS process with throughput faster than 250 Mbit/s.

AB - This paper proposes a self-reseeding pseudo RNG (PRNG) based on digitized logistic map to introduce small perturbations periodically so that the low-period can be removed and the randomness can be enhanced. The strategy and the optimization of selecting reseeding period with corresponding fixed pattern are demonstrated. The resultant PRNG generates random sequence fulfilling all the randomness requirements in proportion of NIST SP 800-22 test suite, and the average period can be more than 65 folds. Furthermore, the proposed PRNG is validated by a hardware implementation using TSMC 0.18 μm CMOS process with throughput faster than 250 Mbit/s.

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DO - 10.1109/VDAT.2010.5496703

M3 - 会议稿件

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SN - 9781424452712

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BT - Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010

T2 - 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010

Y2 - 26 April 2010 through 29 April 2010

ER -

A nonlinear PRNG using digitized logistic map with self-reseeding method

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