A note on Suhir's solution of thermal stresses for a die-substrate assembly

M. Y. Tsai*, C. H. Hsu, C. N. Han

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

85 Scopus citations

Abstract

The well-known, closed-form solution to thermal stresses of a die-substrate assembly is initially provided by Suhir in the mid-1980's after Timoshenko and Chen and Nelson. It has been revised several times in its die attach (adhesive) peel solution by Suhir, and Mishkevich and Suhir. However, there still exist some controversies and inconsistencies regarding die stresses, die attach shear and peel stresses, and warpage (deformation) of the assembly. In the study, Suhir's derivation of the solution is closely examined in details, and the corrections to the solution are suggested and verified by comparing with the finite element results. It is shown that, unlike the original Suhir solution, the corrected one gives very good prediction of thermal stresses and deformations of die-substrate assembly. The limitation of the Suhir solution is also discussed in this study.

Original languageEnglish
Pages (from-to)115-119
Number of pages5
JournalJournal of Electronic Packaging, Transactions of the ASME
Volume126
Issue number1
DOIs
StatePublished - 03 2004

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