Abstract
High power LEDs are replacing the traditional lighting sources due its wide range of advantages. However, their reliability remain a concern due to the lack of understanding in terms of their failure mechanisms and related reliability studies, especially in outdoor applications. In this work, a comprehensive review on the study of humidity and high temperature based degradation mechanisms for high power LEDs is reported. The failure mechanism is found to vary at various humidity levels as well as during their life cycles. This renders the existing lifetime prediction models inapplicable for high power LEDs.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2016 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 383-386 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781467382588 |
| DOIs | |
| State | Published - 09 09 2016 |
| Event | 23rd IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2016 - Singapore, Singapore Duration: 18 07 2016 → 21 07 2016 |
Publication series
| Name | Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA |
|---|---|
| Volume | 2016-September |
Conference
| Conference | 23rd IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2016 |
|---|---|
| Country/Territory | Singapore |
| City | Singapore |
| Period | 18/07/16 → 21/07/16 |
Bibliographical note
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