A review on the humidity reliability of high power white light LEDs

  • Preetpal Singh
  • , Cher Ming Tan*
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

20 Scopus citations

Abstract

High power white LEDs are replacing current lighting sources, not only for indoor usage, but also for outdoor and harsher environmental applications. This calls for higher reliability with respect to electrical, thermal as well as humidity. In this work, a comprehensive review on the study of humidity reliability of high power LEDs is provided, and the humidity induced degradation mechanisms in packaged high power white LEDs and their failure sites are described. The failure degradation mechanisms are divided into three groups, namely the package level, chip level and interconnect level degradations. Modeling of the moisture degradation is also described, and new test designed for the humidity study is also introduced. The inability of current acceleration model to extrapolate accelerated test results to normal operating conditions for high power LEDs is shown, and this provides a new challenge for the estimation of the lifetime of high power LEDs under normal applications, along with other challenges that need to be addressed.

Original languageEnglish
Pages (from-to)129-139
Number of pages11
JournalMicroelectronics Reliability
Volume61
DOIs
StatePublished - 01 06 2016

Bibliographical note

Publisher Copyright:
© 2015 Elsevier Ltd.

Keywords

  • Degradation
  • Extrapolation
  • Finite element moisture modeling
  • Humidity
  • LEDs
  • Reliability

Fingerprint

Dive into the research topics of 'A review on the humidity reliability of high power white light LEDs'. Together they form a unique fingerprint.

Cite this