A study of the Growth‐Temperature‐dependent Surface Morphology in InSb Liquid Phase Epitaxy

L. B. Chang*

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

1 Scopus citations

Abstract

InSb LPE layers were grown on (111) InSb substrates, their phase diagram and growth rates studied. The InSb activity coefficient α(T), determined by fitting the experimental data, had a value of 2556–11.11 · T cal · mole−1. The terraces on the surface were reduced by increasing the temperature to 350 °C. Hall measurements of InSb/CdTe heterostructure failed due to the high Te segregation. The carrier concentration of these InSb epilayers, however, was determined by C‐V measurements with values between 7.5 · 1014 cm−3 and 5 · 1015 cm−3.

Original languageEnglish
Pages (from-to)187-192
Number of pages6
JournalCrystal Research and Technology
Volume26
Issue number2
DOIs
StatePublished - 1991
Externally publishedYes

Fingerprint

Dive into the research topics of 'A study of the Growth‐Temperature‐dependent Surface Morphology in InSb Liquid Phase Epitaxy'. Together they form a unique fingerprint.

Cite this