Abnormal Degradation Behaviors Under Negative Bias Stress in Flexible p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors After Laser Lift-Off Process
Chia Chuan Wu, William Cheng Yu Ma*, Ting Chang Chang*, Yu Xuan Wang, Mao Chou Tai, Yu Fa Tu, Yu An Chen, Hong Yi Tu, Ya Ting Chien, Han Yu Chang, Bo Shen Huang
Research output: Contribution to journal › Journal Article › peer-review
2Scopus
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