Abstract
In this study, we propose three new sampling plans based on yield index CpuA for linear profiles with one-sided specifications, including the resubmitted sampling plan, the repetitive group sampling plan, and the multiple dependent state repetitive sampling plan. The operating characteristic functions of our proposed sampling plans are developed. The plan parameters of our proposed sampling plans are determined through nonlinear optimization. The plan parameters are reported for various combinations of acceptable quality level and limiting quality level. The three sampling plans are compared with the existing single sampling plan in terms of the average sample number. A real example is used to illustrate the applications.
| Original language | English |
|---|---|
| Pages (from-to) | 806-816 |
| Number of pages | 11 |
| Journal | Journal of Statistical Computation and Simulation |
| Volume | 87 |
| Issue number | 4 |
| DOIs | |
| State | Published - 04 03 2017 |
| Externally published | Yes |
Bibliographical note
Publisher Copyright:© 2016 Informa UK Limited, trading as Taylor & Francis Group.
Keywords
- Resubmitted sampling plan
- linear profiles
- multiple dependent state repetitive sampling plan
- repetitive group sampling plan
- yield index