Acceptance sampling plans for linear profiles with one-sided specifications

Muhammad Aslam*, Fu Kwun Wang

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

11 Scopus citations

Abstract

In this study, we propose three new sampling plans based on yield index CpuA for linear profiles with one-sided specifications, including the resubmitted sampling plan, the repetitive group sampling plan, and the multiple dependent state repetitive sampling plan. The operating characteristic functions of our proposed sampling plans are developed. The plan parameters of our proposed sampling plans are determined through nonlinear optimization. The plan parameters are reported for various combinations of acceptable quality level and limiting quality level. The three sampling plans are compared with the existing single sampling plan in terms of the average sample number. A real example is used to illustrate the applications.

Original languageEnglish
Pages (from-to)806-816
Number of pages11
JournalJournal of Statistical Computation and Simulation
Volume87
Issue number4
DOIs
StatePublished - 04 03 2017
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2016 Informa UK Limited, trading as Taylor & Francis Group.

Keywords

  • Resubmitted sampling plan
  • linear profiles
  • multiple dependent state repetitive sampling plan
  • repetitive group sampling plan
  • yield index

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