Abstract
In this study, n-type Al-doped MgxZn1-xO (AMZO) films were deposited onto p-Al0.08Ga0.92N by using radiofrequency magnetron sputtering followed by annealing at 800°C in nitrogen ambient for 60 s. The film was highly transparent and had transmittances exceeding 95% in the visible region and a sharp absorption edge visible in the ultraviolet region. A high leakage current was obtained in the current-voltage (I-V) characteristics of the GMZO/AlGaN n-p junction diode. The AMZO/AlGaN photodetector based on the AMZO film exhibited a dark current of 1.56 μA at Vbias =-3V. The peak responsivity of the photodetector was approximately 200 nm and a cutoff wavelength was observed at approximately 250 nm.
Original language | English |
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Title of host publication | International Seminar on Photonics, Optics, and Its Applications, ISPhOA 2014 |
Editors | Aulia Nasution |
Publisher | SPIE |
ISBN (Electronic) | 9781628415599 |
DOIs | |
State | Published - 2015 |
Event | International Seminar on Photonics, Optics, and Its Applications, ISPhOA 2014 - Sanur, Bali, Indonesia Duration: 14 10 2014 → 15 10 2014 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 9444 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | International Seminar on Photonics, Optics, and Its Applications, ISPhOA 2014 |
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Country/Territory | Indonesia |
City | Sanur, Bali |
Period | 14/10/14 → 15/10/14 |
Bibliographical note
Publisher Copyright:© 2015 SPIE.
Keywords
- AlO
- MgO
- MgZnO
- ZnO
- heterojunction
- photo-detector
- rapid thermal annealing
- responsivity
- sputter
- ultraviolet