Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement

H. C. Wei; C. C. Tsai; C. Chou

doi:10.1109/AOE.2007.4410696

Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement

H. C. Wei, C. C. Tsai, C. Chou

National Yang Ming Chiao Tung University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This research proposes an amplitude-sensitive heterodyne interferometric ellipsometer to determine TN-LC cell parameters precisely based on single wavelength at normal incidence. The advantage is the capability of two dimensional distribution measurement using CCD camera.

Original language	English
Title of host publication	2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE
Pages	37-39
Number of pages	3
DOIs	https://doi.org/10.1109/AOE.2007.4410696
State	Published - 2007
Externally published	Yes
Event	2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE - Shanghai, China Duration: 17 10 2007 → 19 10 2007

Publication series

Name	2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE

Conference

Conference	2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE
Country/Territory	China
City	Shanghai
Period	17/10/07 → 19/10/07

Access to Document

10.1109/AOE.2007.4410696

Cite this

Wei, H. C., Tsai, C. C., & Chou, C. (2007). Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement. In 2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE (pp. 37-39). Article 4410696 (2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE). https://doi.org/10.1109/AOE.2007.4410696

@inproceedings{b37cd7d66944404ba5adbd65a66b258d,

title = "Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement",

abstract = "This research proposes an amplitude-sensitive heterodyne interferometric ellipsometer to determine TN-LC cell parameters precisely based on single wavelength at normal incidence. The advantage is the capability of two dimensional distribution measurement using CCD camera.",

author = "Wei, {H. C.} and Tsai, {C. C.} and C. Chou",

year = "2007",

doi = "10.1109/AOE.2007.4410696",

language = "英语",

isbn = "0978921739",

series = "2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE",

pages = "37--39",

booktitle = "2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE",

note = "2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE ; Conference date: 17-10-2007 Through 19-10-2007",

}

Wei, HC, Tsai, CC & Chou, C 2007, Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement. in 2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE., 4410696, 2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE, pp. 37-39, 2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE, Shanghai, China, 17/10/07. https://doi.org/10.1109/AOE.2007.4410696

Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement. / Wei, H. C.; Tsai, C. C.; Chou, C.
2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE. 2007. p. 37-39 4410696 (2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement

AU - Wei, H. C.

AU - Tsai, C. C.

AU - Chou, C.

PY - 2007

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N2 - This research proposes an amplitude-sensitive heterodyne interferometric ellipsometer to determine TN-LC cell parameters precisely based on single wavelength at normal incidence. The advantage is the capability of two dimensional distribution measurement using CCD camera.

AB - This research proposes an amplitude-sensitive heterodyne interferometric ellipsometer to determine TN-LC cell parameters precisely based on single wavelength at normal incidence. The advantage is the capability of two dimensional distribution measurement using CCD camera.

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DO - 10.1109/AOE.2007.4410696

M3 - 会议稿件

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SN - 0978921739

SN - 9780978921736

T3 - 2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE

SP - 37

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BT - 2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE

T2 - 2007 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE

Y2 - 17 October 2007 through 19 October 2007

ER -

Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement

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