TY - GEN
T1 - An all-digital duty cycle corrector
AU - Chen, Bo Jiun
AU - Kao, Shao Ku
AU - Liu, Shen Iuan
PY - 2007
Y1 - 2007
N2 - An all-digital 50% duty cycle corrector (DCC) is presented. The features of the proposed DCC include a wide operation frequency range, a wide input duty cycle range for the input clock, and a short locked time to recover the duty cycle of 50%. This digital DCC has been implemented in a 0.35μm 2P4M CMOS process. The acceptable duty cycle and frequency range of the input clock is 25%-75% and 250MHz-600MHz, respectively. The measured peak-peak jitter is 1.7.3ps at 600MHz, Besides, this DCC saves the power consumption by turning off a half delay line. Its power consumption is 16mW at 600MHz.
AB - An all-digital 50% duty cycle corrector (DCC) is presented. The features of the proposed DCC include a wide operation frequency range, a wide input duty cycle range for the input clock, and a short locked time to recover the duty cycle of 50%. This digital DCC has been implemented in a 0.35μm 2P4M CMOS process. The acceptable duty cycle and frequency range of the input clock is 25%-75% and 250MHz-600MHz, respectively. The measured peak-peak jitter is 1.7.3ps at 600MHz, Besides, this DCC saves the power consumption by turning off a half delay line. Its power consumption is 16mW at 600MHz.
UR - https://www.scopus.com/pages/publications/34748813723
U2 - 10.1109/VDAT.2006.258158
DO - 10.1109/VDAT.2006.258158
M3 - 会议稿件
AN - SCOPUS:34748813723
SN - 1424401798
SN - 9781424401796
T3 - 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers
SP - 195
EP - 198
BT - 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers
T2 - 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006
Y2 - 26 April 2007 through 28 April 2007
ER -