An assessment of testing-effort dependent software reliability growth models

Chin Yu Huang*, Sy Yen Kuo, Michael R. Lyu

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

175 Scopus citations

Abstract

Over the last several decades, many Software Reliability Growth Models (SRGM) have been developed to greatly facilitate engineers and managers in tracking and measuring the growth of reliability as software is being improved. However, some research work indicates that the delayed S-shaped model may not fit the software failure data well when the testing-effort spent on fault detection is not a constant. Thus, in this paper, we first review the logistic testing-effort function that can be used to describe the amount of testing-effort spent on software testing. We describe how to incorporate the logistic testing-effort function into both exponential-type, and S-shaped software reliability models. The proposed models are also discussed under both ideal, and imperfect debugging conditions. Results from applying the proposed models to two real data sets are discussed, and compared with other traditional SRGM to show that the proposed models can give better predictions, and that the logistic testing-effort function is suitable for incorporating directly into both exponential-type, and S-shaped software reliability models.

Original languageEnglish
Pages (from-to)198-211
Number of pages14
JournalIEEE Transactions on Reliability
Volume56
Issue number2
DOIs
StatePublished - 06 2007
Externally publishedYes

Keywords

  • Delayed S-shaped model
  • Imperfect debugging
  • Non-homogeneous Poisson process
  • Software reliability growth models
  • Testing-effort function

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