Abstract
The structural, optical, and electrical properties of indium tin oxide (ITO) films coated on soda lime glasses with and without a barrier layer of TiO2-SiO2 composite films before and after annealing in air at 300 and 500°C for 1 h have been systematically investigated using a x-ray diffractometer (XRD), spectrophotometer, and four-point probe, respectively. A TiO2-SiO2 barrier layer and an ITO layer were sequentially deposited onto unheated glass substrates by reactive ion-assisted electron-beam evaporation (IAD) using an advanced plasma source. Correlations between these properties and annealing temperatures and barrier-layer compositions are discussed. The suppression effect of a barrier layer on the outdiffusion of Na atoms from the soda lime glass substrate through the barrier layer into the ITO layer is investigated with secondary-ion mass spectrometry (SIMS). With respect to the optical and electrical requirements of ITO electrodes used in liquid crystal display (LCD) panels, ITO-coated soda lime glasses with a barrier layer of TiO2-SiO2 composite films with TiO2<50 at. % are superior to those with a barrier layer of SiO2.
Original language | English |
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Pages (from-to) | 2335-2340 |
Number of pages | 6 |
Journal | Optical Engineering |
Volume | 36 |
Issue number | 8 |
DOIs | |
State | Published - 08 1997 |
Externally published | Yes |
Keywords
- Indium tin oxide (ITO)
- Ion-assisted electron-beam evaporation
- Liquid crystal display LCD
- Soda lime glass
- Structural, optical and electrical properties