Annealing of sputter-deposited nanocrystalline Cr-Ta coatings in a low-oxygen-containing atmosphere

Li Chun Chang*, Yung I. Chen, Hsuan Ling Kao

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

5 Scopus citations

Abstract

As a protective hard coating on glass molding dies, Cr-Ta coatings were fabricated on binderless tungsten carbide substrates with a Ti interlayer by RF magnetron sputtering. The nanocrystalline Cr-Ta coatings were deposited at 550 °C, which revealed one nanocrystalline phase for the Ta-rich coating and two nanocrystalline phases for the Cr-rich coating. Annealing treatment was conducted at 600 °C in a 12 ppm O2-N2 atmosphere to evaluate the coating performance in a realistic glass molding environment. Both Auger electron spectroscopy and X-ray photoelectron spectroscopy depth profiles verified the outward diffusion of Cr, which formed a protective coating for the Cr-rich coatings. A scale of Cr2O3 and a Cr-depleted transition zone near the surface were identified by conducting a transmission electron microscopy investigation on the annealed Cr0.71Ta 0.29 coating. The Cr-rich coating absorbed a smaller amount of oxygen, exhibited greater hardness, and maintained nanoscale surface roughness after annealing in the glass molding atmosphere, thus making it an appropriate protective coating for the die material.

Original languageEnglish
Pages (from-to)6929-6934
Number of pages6
JournalThin Solid Films
Volume520
Issue number23
DOIs
StatePublished - 30 09 2012

Keywords

  • Annealing
  • Chromium tantalum coatings
  • Hard coatings
  • Nanocrystalline coatings
  • Oxidation
  • RF magnetron sputtering
  • X-ray photoelectron spectroscopy

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