| Translated title of the contribution | 以X光光電子能譜儀分析超淺接面之研究 |
|---|---|
| Original language | American English |
| Supervisors/Advisors |
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| State | Published - 2011 |
| Externally published | Yes |
Application of X-Ray Photoelectron Spectroscopy on Analysis of Ultra-Shallow Junctions
- 蘇皖亭
Research output: Types of Thesis › Master's thesis