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Applying grey model to predict the useful lifetime for high-power white LEDs

  • Fu Kwun Wang*
  • , Yi Chen Lu
  • , Tao Peng Chu
  • *Corresponding author for this work
  • National Taiwan University of Science and Technology
  • Dell Incorporated

Research output: Contribution to journalJournal Article peer-review

4 Scopus citations

Abstract

An accelerated degradation test has been widely used to analyze the useful lifetime of high-power white light-emitting diodes (HPWLEDs). A two-stage method is proposed to predict the useful lifetime of HPWLEDs. In the first stage, an exponential model first fits the degradation data. In the second stage, a response model based on an inverse power (exponential) law under different stresses is derived for predicting the useful lifetime under normal operating conditions. To improve the fitting accuracy for the degradation data, we consider the grey model. The useful lifetimes based on the exponential and grey models using the two-stage method are obtained as 192,317 and 184,538 h, respectively.

Original languageEnglish
Article number67
Pages (from-to)1-15
Number of pages15
JournalOptical and Quantum Electronics
Volume48
Issue number1
DOIs
StatePublished - 01 01 2016
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2015, Springer Science+Business Media New York.

Keywords

  • Accelerated degradation test
  • Grey model
  • Two-stage method
  • Useful lifetime

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