Applying various learning curves to hyper-geometric distribution software reliability growth model

Rong Huei Hou*, Sy Yen Kuo, Yi Ping Chang

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

26 Scopus citations

Abstract

The Hyper-Geometric Distribution software reliability growth Model (HGDM) has been shown to be able to estimate the number of faults initially resident in a program at the beginning of the test-and-debug phase. A key factor of the HGDM is the 'sensitivity factor', which represents the number of faults discovered and rediscovered at the application of a test instance. The learning curve incorporated in the sensitivity factor is generally assumed to be linear in the literature. However, this assumption is apparently not realistic in many applications. We propose two new sensitivity factors based on the exponential learning curve and the S-shaped learning curve, respectively. Furthermore, the growth curves of the cumulative number of discovered faults for the HGDM with the proposed learning curves are investigated. Extensive experiments have been performed based on two real test/debug data sets, and the results show that the HGDM with the proposed learning curves estimates the number of initial faults better than previous approaches.

Original languageEnglish
Pages (from-to)8-17
Number of pages10
JournalProceedings of the International Symposium on Software Reliability Engineering, ISSRE
StatePublished - 1994
Externally publishedYes
EventProceedings of the 4th International Symposium on Software Reliability Engineering - Monterey, CA, USA
Duration: 06 11 199409 11 1994

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