Bump and underfill effects on thermal behaviors of flip-chip LED packages: Measurement and modeling

Ming Yi Tsai, Chung Yi Tang, Chia Yi Yen, Liann Be Chang

Research output: Contribution to journalJournal Article peer-review

28 Scopus citations

Abstract

The goal of this paper is to experimentally and numerically study the thermal behaviors of flip-chip (FC) light-emitting diode (LED) packages with and without underfills and, furthermore, to compare it with conventional wire-bonding LED packages in order to understand its thermal dissipation mechanism. In experimental analyses, the junction temperature Tj and surface temperatures are measured by a junction temperature tester, thermal couples, and an infrared thermal imager, whereas the numerical analysis is carried out by an ANSYS simulation. After the validation of the simulation model with experimental results, the effects of FC bump number and underfill thermal conductivity on both Tj and thermal resistance Rth of the packages are investigated by this validated model. Furthermore, a simple model of effective thermal conductivity for a composite material of bumps and underfills is proposed for thermal analysis of the FCLED packages. Thermal results for the packages are presented and discussed in terms of volume fraction and thermal conductivity for bumps and underfills in this paper.

Original languageEnglish
Article number6471193
Pages (from-to)161-168
Number of pages8
JournalIEEE Transactions on Device and Materials Reliability
Volume14
Issue number1
DOIs
StatePublished - 03 2014

Keywords

  • Flip chip (FC)
  • Thermal resistance
  • junction temperature
  • light-emitting diode (LED)

Fingerprint

Dive into the research topics of 'Bump and underfill effects on thermal behaviors of flip-chip LED packages: Measurement and modeling'. Together they form a unique fingerprint.

Cite this