Abstract
An attempt was made to calculate the sputtering rate of a cathode during a plasma-assisted deposition or etching process. In this attempt, an approach combining sputtering models and Monte Carlo simulation was developed. By using a Cr target as an example, the approach was shown to be satisfactory.
| Original language | English |
|---|---|
| Pages (from-to) | 5295-5298 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 42 |
| Issue number | 8 |
| DOIs | |
| State | Published - 08 2003 |
| Externally published | Yes |
Keywords
- Cr thin film
- Monte Carlo simulation
- Sputtering rate