Capacitance characteristics and breakdown mechanism of Algan/Gan metal-semiconductor-metal varactors and their anti-surge application

Chien Fu Shih, Yu Li Hsieh, Liann Be Chang*, Ming Jer Jeng, Zi Xin Ding, Shao An Huang

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

2 Scopus citations

Abstract

The AlGaN/GaN materials with a wide band gap, high electron mobility, and high breakdown voltage are suitable for manufacturing high-power and high-frequency electronic devices. In this study, metal Schottky contact electrodes of different dimensions are prepared on AlGaN/GaN wafers to fabricate metal-semiconductor-metal (MSM) varactors. Voltage-dependent capacitance and breakdown voltages of the varactors are measured and studied. The corresponding breakdown mechanisms of varactors with different electrode gaps are proposed. Furthermore, an anti-surge application using GaN-based MSM varactors in a signal transmission module is demonstrated, and its surge suppression capability is shown. We believe that our study will be beneficial in developing surge protection circuits for RF applications.

Original languageEnglish
Article number292
JournalCrystals
Volume10
Issue number4
DOIs
StatePublished - 04 2020

Bibliographical note

Publisher Copyright:
© 2020 by the authors. Licensee MDPI, Basel, Switzerland.

Keywords

  • AlGaN/GaN
  • Anti-surge
  • Breakdown
  • Metal-semiconductor-metal
  • Varactors

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