| Translated title of the contribution | 氟化二氧化鉿低溫多晶矽薄膜電晶體之特性與可靠度探討 |
|---|---|
| Original language | American English |
| Supervisors/Advisors |
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| State | Published - 2008 |
| Externally published | Yes |
Characteristics and Reliability of LTPS TFTs with Fluorinated High-K HfO2 Gate Dielectrics
陳智偉
Research output: Types of Thesis › Master's thesis