Characteristics of GaN/InGaN double-heterostructure photovoltaic cells

Ming Hsien Wu, Sheng Po Chang*, Shoou Jinn Chang, Ray Hua Horng, Wen Yih Liao, Ray Ming Lin

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

5 Scopus citations

Abstract

The p-GaN/i-Inx Ga1-x N/n-GaN double-heterostructure photovoltaic (PV) cells have been fabricated and the theoretical photovoltaic properties were also calculated in this work. From theoretical simulation, higher efficiency can be obtained in GaN/InGaN double-heterostructure photovoltaic cells with higher In composition in i-InGaN intrinsic layer. GaN/InGaN double-heterostructure photovoltaic cells with In compositions of 10, 12, and 14 were fabricated and characterized for demonstrating with the simulated results. The corresponding photoelectrical conversion efficiency of fabricated GaN/InGaN photovoltaic cells with In compositions of 10, 12, and 14 is 0.51, 0.53, and 0.32 under standard AM 1.5G measurement condition, respectively. GaN/InGaN photovoltaic cells with In composition of 10 showed high open-circuit voltage (Voc) of 2.07 V and fill factor (F.F.) of 80.67. The decrease of Voc and FF was observed as In composition increasing from 10 to 14. For comparing with the fabricated GaN/InGaN photovoltaic cells, theoretical conversion efficiency of GaN/InGaN photovoltaic cells with In compositions of 10, 12, and 14, is 1.80, 2.04, and 2.27, respectively. The difference of GaN/InGaN photovoltaic properties between theoretical simulation and experimental measurement could be attributed to the inferior quality of InGaN epilayer and GaN/InGaN interface generated as the increase of In composition.

Original languageEnglish
Article number206174
JournalInternational Journal of Photoenergy
Volume2012
DOIs
StatePublished - 2012

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