Characteristics of PBTI and hot carrier stress for LTPS-TFT with high-κ gate dielectric

Ming Wen Ma*, Chih Yang Chen, Chun Jung Su, Woei Cherng Wu, Yi Hong Wu, Kuo Hsing Kao, Tien Sheng Chao, Tan Fu Lei

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

19 Scopus citations

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