Characteristics of PBTI and hot carrier stress for LTPS-TFT with high-κ gate dielectric
- Ming Wen Ma*
- , Chih Yang Chen
- , Chun Jung Su
- , Woei Cherng Wu
- , Yi Hong Wu
- , Kuo Hsing Kao
- , Tien Sheng Chao
- , Tan Fu Lei
*Corresponding author for this work
- National Yang Ming Chiao Tung University
- Feng Chia University
Research output: Contribution to journal › Journal Article › peer-review
20
Scopus
citations