Characterization of fractal surfaces

Jiunn Jong Wu

doi:10.1016/S0043-1648(99)00362-2

Characterization of fractal surfaces

Jiunn Jong Wu^*

^*Corresponding author for this work

Chinese Culture University

Research output: Contribution to journal › Journal Article › peer-review

101 Scopus citations

Abstract

Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.

Original language	English
Pages (from-to)	36-47
Number of pages	12
Journal	Wear
Volume	239
Issue number	1
DOIs	https://doi.org/10.1016/S0043-1648(99)00362-2
State	Published - 04 2000
Externally published	Yes

Keywords

Asperity
Fractal surface
Root mean square

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10.1016/S0043-1648(99)00362-2

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title = "Characterization of fractal surfaces",

abstract = "Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.",

keywords = "Asperity, Fractal surface, Root mean square",

author = "Wu, \{Jiunn Jong\}",

year = "2000",

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AU - Wu, Jiunn Jong

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N2 - Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.

AB - Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.

KW - Asperity

KW - Fractal surface

KW - Root mean square

UR - https://www.scopus.com/pages/publications/0034039677

U2 - 10.1016/S0043-1648(99)00362-2

DO - 10.1016/S0043-1648(99)00362-2

M3 - 文章

AN - SCOPUS:0034039677

SN - 0043-1648

VL - 239

SP - 36

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JO - Wear

JF - Wear

IS - 1

ER -

Characterization of fractal surfaces

Abstract

Keywords

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