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Characterization of interface fluctuations and emission mechanisms in InGaN/AlGaN multiple quantum wells

  • Jiunn Chyi Lee
  • , Ya Fen Wu
  • , Chia Hui Fang
  • , Jen Cheng Wang
  • , Tzer En Nee*
  • *Corresponding author for this work
  • Taipei City University of Science and Technology
  • Chang Gung University

Research output: Contribution to journalJournal Article peer-review

Abstract

The InGaN/AlGaN multiple- quantum- well heterostructures were fabricated by metal-organic chemical vapor deposition system. Samples were grown with different indium and aluminum content during the growth of InGaN well layers and AlGaN barrier layers. The exciton-localization effect on the performance of the samples is investigated by means of temperature-dependent photoluminescence measurements. The dependence of optical characteristics on temperature is consistent with recombination mechanisms involving band-tail states. For sample with higher indium content in the well layer, the localization effect is enhanced; in contrast, the effect is weakened for sample with higher aluminum content in the barrier layer.

Original languageEnglish
Pages (from-to)568-571
Number of pages4
JournalPhysica B: Condensed Matter
Volume401-402
DOIs
StatePublished - 15 12 2007

Keywords

  • Band-tail states
  • Exciton-localization effect
  • InGaN/AlGaN multiple-quantum-well heterostructures
  • Photoluminescence
  • Quantum-confined Stark effect

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