Charge-based current model for CMOS gates

J. H. Wang; J. T. Fan; W. S. Feng

doi:10.1049/el:19930900

Charge-based current model for CMOS gates

J. H. Wang
, J. T. Fan
, W. S. Feng

National Taiwan University

Research output: Contribution to journal › Journal Article › peer-review

Abstract

A charge-based current model is introduced for the first time, which includes the current waveforms induced by non-active events. Time-domain current waveforms can be obtained and the results show good agreement with SPICE. Three error values, DC, Max_I, and Max_T, differ by no more than 10% from SPICE.

Original language	English
Pages (from-to)	1343-1345
Number of pages	3
Journal	Electronics Letters
Volume	29
Issue number	15
DOIs	https://doi.org/10.1049/el:19930900
State	Published - 07 1993
Externally published	Yes

Keywords

CMOS integrated circuits
Logic gates
Semiconductor
devices models

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10.1049/el:19930900

Cite this

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title = "Charge-based current model for CMOS gates",

abstract = "A charge-based current model is introduced for the first time, which includes the current waveforms induced by non-active events. Time-domain current waveforms can be obtained and the results show good agreement with SPICE. Three error values, DC, Max\_I, and Max\_T, differ by no more than 10\% from SPICE.",

keywords = "CMOS integrated circuits, Logic gates, Semiconductor, devices models",

author = "Wang, \{J. H.\} and Fan, \{J. T.\} and Feng, \{W. S.\}",

year = "1993",

month = jul,

doi = "10.1049/el:19930900",

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volume = "29",

pages = "1343--1345",

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publisher = "John Wiley \& Sons Inc.",

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AU - Wang, J. H.

AU - Fan, J. T.

AU - Feng, W. S.

PY - 1993/7

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N2 - A charge-based current model is introduced for the first time, which includes the current waveforms induced by non-active events. Time-domain current waveforms can be obtained and the results show good agreement with SPICE. Three error values, DC, Max_I, and Max_T, differ by no more than 10% from SPICE.

AB - A charge-based current model is introduced for the first time, which includes the current waveforms induced by non-active events. Time-domain current waveforms can be obtained and the results show good agreement with SPICE. Three error values, DC, Max_I, and Max_T, differ by no more than 10% from SPICE.

KW - CMOS integrated circuits

KW - Logic gates

KW - Semiconductor

KW - devices models

UR - https://www.scopus.com/pages/publications/0027635571

U2 - 10.1049/el:19930900

DO - 10.1049/el:19930900

M3 - 文章

AN - SCOPUS:0027635571

SN - 0013-5194

VL - 29

SP - 1343

EP - 1345

JO - Electronics Letters

JF - Electronics Letters

IS - 15

ER -

Charge-based current model for CMOS gates

Abstract

Keywords

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