Control factor selection and solder residue problem study in flip chip process

Jian Long Kuo*, Chun Cheng Kuo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, the solder residue problem is studied. The control factors are discussed to select the essential factors that affect the flip chip process. Pad type, pad size, open shape and opening gap are selected as the four essential factors to be discussed. The objective problems for discussion are the beads quantity and beads size. Experimental results reveal that the overall problem has been successfully formulated and described.

Original languageEnglish
Title of host publicationMaterials Processing Technologies
Pages1804-1812
Number of pages9
DOIs
StatePublished - 2011
Externally publishedYes
Event2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010 - Shenzhen, China
Duration: 06 11 201008 11 2010

Publication series

NameAdvanced Materials Research
Volume154-155
ISSN (Print)1022-6680

Conference

Conference2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010
Country/TerritoryChina
CityShenzhen
Period06/11/1008/11/10

Keywords

  • IC manufacturing process
  • Solder bead
  • Solder residue

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