Control of the in-plane epitaxy for bi-epitaxial grain boundary junctions using a new multilayer structure
- M. Y. Li*
- , H. L. Kao
- , W. J. Chang
- , C. L. Lin
- , C. C. Chi
- , Weiyan Guan
- , M. K. Wu
*Corresponding author for this work
Research output: Contribution to journal › Journal Article › peer-review
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