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Control of the in-plane epitaxy for bi-epitaxial grain boundary junctions using a new multilayer structure
M. Y. Li*, H. L. Kao, W. J. Chang, C. L. Lin, C. C. Chi, Weiyan Guan, M. K. Wu
*Corresponding author for this work
Research output: Contribution to journal › Journal Article › peer-review
10
Scopus
citations